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Growth and Characterization of Lu2O3:Eu3+Thin Films on Single-Crystal Yttria-Doped Zirconia

โœ Scribed by Sudesna Roy, Stephen Topping, Vinod Sarin

Book ID
120951668
Publisher
The Minerals, Metals & Materials Society
Year
2013
Tongue
English
Weight
722 KB
Volume
65
Category
Article
ISSN
1047-4838

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Y 2 O 3 thin films were grown on silicon (1 0 0) substrates by pulsed-laser deposition at different substrate temperatures and O 2 pressures. The structure and composition of films are studied by using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The Y 2 O 3 thin films deposit