A high quality ZnGeP 2 (ZGP) single crystal 22 mm in diameter and 70 mm in length was grown by a modified vertical Bridgman method. The as-grown and annealed crystals were characterized using XRD, IR spectrophotometers, positron annihilation lifetime (PAL), Hall Effect and resistivity measurements.
Growth and annealing characterization of ZnGeP2 crystal
โ Scribed by Yongjuan Yang; Yujun Zhang; Qingtian Gu; Huaijin Zhang; Xutang Tao
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 648 KB
- Volume
- 318
- Category
- Article
- ISSN
- 0022-0248
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