Grain-boundary structure of thin films of YBa2Cu3O7 and Bi2Sr2CaCu2O8 on bicrystalline substrates

✍ Scribed by B. Kabius; J.W. Seo; T. Amrein; U. Dähne; A. Scholen; M. Siegel; K. Urban; L. Schultz

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 919 KB
• Volume: 231
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(94)90151-1

✦ Synopsis

Thin films of YBa2Cu30~ and Bi2Sr2CaCu2Os were deposited by high-pressure oxygen sputtering and laser ablation, respectively, on bicrystailine substrates of SrTiO3 with angles of 10,24,36 and 45 degrees. The microstructure of the grain boundary in the substrate and in the film was characterized by transmission electron microscopy. While the grain boundary in the substrate was found to be almost rectilinear with a maximum roughness of about 3 nm, the grain boundaries in the superconducting films exhibited a roughness of up to 200 nm for YBa2Cu30~ and up to 1 I~m for Bi2Sr2CaCu2Os. The grain boundaries consist of facets, which have a low index habit plane in common with one of the adjacent grains. These facets can be found on a length scale extending from several nanometers up to one micrometer. It is concluded that the exact lateral position of the trflm grain boundary is not only determined by the substrate but also by the coalescence of growth islands during the lrflm-deposition process. The microstructural results are discussed with respect to their impact on the electrical properties.