✦ LIBER ✦

Glass fracture surfaces seen with an atomic force microscope

✍ Scribed by C. Wünsche; Edda Rädlein; Günther Heinz Frischat

Book ID: 105896768
Publisher: Springer
Year: 1997
Tongue: English
Weight: 225 KB
Volume: 358
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050426

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Nanolithography with an atomic force mic

Nanolithography with an atomic force microscope

✍ M. Wendel; B. Irmer; J. Cortes; R. Kaiser; H. Lorenz; J.P. Kotthaus; A. Lorke; E 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 547 KB

Dynamic friction measurements with an at

Dynamic friction measurements with an atomic force microscope on polymer surfaces

✍ Krotil, Hans-Ulrich ;Marti, Othmar 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 712 KB

Nanooxidation ofn-In0.53Ga0.47As with an

Nanooxidation ofn-In0.53Ga0.47As with an atomic force microscope

✍ D. V. Sokolov 📂 Article 📅 2002 🏛 Springer 🌐 English ⚖ 184 KB

Imaging surfaces of hydrophilic contact

Imaging surfaces of hydrophilic contact lenses with the atomic force microscope

✍ Joël Baguet; Françoise Sommer; Tran Minh Duc 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 970 KB

Locally enhanced Raman spectroscopy with

Locally enhanced Raman spectroscopy with an atomic force microscope

✍ Anderson, Mark S. 📂 Article 📅 2000 🏛 American Institute of Physics 🌐 English ⚖ 332 KB

SiO2and Si nanoscale patterning with an

SiO2and Si nanoscale patterning with an atomic force microscope

✍ B. Klehn; U. Kunze 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 295 KB

The use of an atomic force microscope (AFM) as a nanolithographic tool is demonstrated. A photoresist layer several nanometre thin is indented by the vibrating AFM tip, where software control switches the tapping force from the imaging to the patterning mode. The resist pattern is transferred into a