Germanium Diodes: A Dilemma Between Shallow Junction Formation and Reverse Leakage Current Control

✍ Scribed by Yu-Lin Chao; Woo, J.C.S.

• Book ID: 114619915
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 542 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2039542