Generic DFT approach for pattern sensitive faults in word-oriented memories

✍ Scribed by Amin, A.A.; Hamzah, A.A.; Abdel-Aal, R.E.

• Book ID: 114448236
• Publisher: The Institution of Electrical Engineers
• Year: 1996
• Tongue: English
• Weight: 457 KB
• Volume: 143
• Category: Article
• ISSN: 1350-2387
• DOI: 10.1049/ip-cdt:19960334