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Generation of interface states by hot hole injection in MOSFET's

โœ Scribed by Gesch, H.; Leburton, J.-P.; Dorda, G.E.


Book ID
114594106
Publisher
IEEE
Year
1982
Tongue
English
Weight
634 KB
Volume
29
Category
Article
ISSN
0018-9383

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Hole injection into SiOz creates interface states not only during the injection, but also after the injection is terminated. This paper studies the annealing behaviour of interface states generated during and post hole injection. Interface states created by different stresses are compared and the ro