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Generalized ellipsometry for the characterization of anisotropic materials: influence of the sample adjustment on the extracted optical indices

✍ Scribed by P. Boher; J.P. Piel; B. Sacépé


Book ID
113936785
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
172 KB
Volume
455-456
Category
Article
ISSN
0040-6090

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