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Generalized analysis of instruments for measuring complex reflection coefficients and impedances

✍ Scribed by M. I. Kamenetskii

Publisher
Springer US
Year
1977
Tongue
English
Weight
403 KB
Volume
20
Category
Article
ISSN
0543-1972

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## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me