General inversion method for single-wavelength ellipsometry of samples with an arbitrary number of layers

✍ Scribed by Bosch, S.; Monzon, F.

• Book ID: 115387499
• Publisher: Optical Society of America
• Year: 1995
• Tongue: English
• Weight: 388 KB
• Volume: 12
• Category: Article
• ISSN: 1084-7529
• DOI: 10.1364/JOSAA.12.001375