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GDOES depth profiling analysis of amorphous Ni-P-plated aluminium hard disks

✍ Scribed by Shimizu, K.; Habazaki, H.; Skeldon, P.; Thompson, G. E.; Wood, G. C.

Publisher: John Wiley and Sons
Year: 2000
Tongue: English
Weight: 174 KB
Volume: 29
Category: Article
ISSN: 0142-2421
DOI: 10.1002/(sici)1096-9918(200002)29:2<151::aid-sia728>3.0.co;2-v

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✦ Synopsis

Amorphous Ni-P-plated aluminium disks for magnetic data storage have been analysed by glow discharge optical emission spectroscopy (GDOES) depth profiling. The distribution of impurities, related to the fabrication processes, have been disclosed within the Ni-P layers and at the Ni-P/aluminium interface. Examination of sputter craters by AFM and surface roughness measurements indicate that the sputtering of the amorphous Ni-P layer proceeds without significant microscopic roughening.

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