Gaussian parametric failure-rate model with application to quartz-crystal device aging

✍ Scribed by Feinberg, A.A.

• Book ID: 114555113
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 558 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.249585