Gaussian parametric failure-rate model with application to Quartz-Crystal device aging : A. A. Feinberg. IEEE Transactions on Reliability, 41(4), 565 (1992)

• Book ID: 103287427
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 111 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90182-1