Gate-controlled diodes for characterization of the Si–SiO2 interface with respect to surface effects of silicon detectors

✍ Scribed by C Becker; C Gößling; C Lichau; T Wübben; J Wüstenfeld; R Wunstorf

• Book ID: 108415655
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 338 KB
• Volume: 444
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/s0168-9002(99)01177-8