Scanning tunneling microscopy and potent
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P. Muralt; H. Meier; D.W. Pohl; H. Salemink
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Article
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1986
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Elsevier Science
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English
⚖ 180 KB
In certain problems of electrical transport through condensed matter, it is important to know the potential distribution with nanometer resolution, e.g.. at interfaces (Schottky barriers) or pn junctions. Scanning tunneling potentiometry, a new application of scanning tunneling microscopy, is capabl