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Fundamental investigations of secondary ion production during ion bombardment

✍ Scribed by T Ishitani; H Tamura; T Shinmiyo


Book ID
118981659
Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
528 KB
Volume
55
Category
Article
ISSN
0039-6028

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD