✦ LIBER ✦

FTIR studies of H2O and D2O decomposition on porous silicon surfaces

✍ Scribed by P. Gupta; A.C. Dillon; A.S. Bracker; S.M. George

Publisher: Elsevier Science
Year: 1991
Weight: 67 KB
Volume: 245
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(91)90780-u

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

FTIR studies of water and ammonia decomp

FTIR studies of water and ammonia decomposition on silicon surfaces

✍ A.C. Dillon; P. Gupta; M.B. Robinson; A.S. Bracker; S.M. George 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 842 KB

Raman frequency and intensity studies of

Raman frequency and intensity studies of liquid H2O, H218O and D2O

✍ M. H. Brooker; G. Hancock; B. C. Rice; J. Shapter 📂 Article 📅 1989 🏛 John Wiley and Sons 🌐 English ⚖ 952 KB

Surface recoiling, XPS and UPS study of

Surface recoiling, XPS and UPS study of chemisorption of H2, O2 and H2O on lanthanum

✍ Ranjit Kumar; Moshe H. Mintz; J.Wayne Rabalais 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 53 KB

In situ Raman spectroscopy study on sili

In situ Raman spectroscopy study on silicon surface in NH4OH/H2O2 and HCl/H2O2 aqueous solutions

✍ J. Wang; H. Tu; Q. Zhou; W. Zhu; A. Liu 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 153 KB

The chemical nature of Si(100) surfaces during immersion in NH OH / H O / H O (SC-1) and HCl / H O / H O (SC-2) 4 2 2 2 2 2 2 has been investigated in situ using confocal Raman spectroscopy. In SC-1 solution, there are two kinds of oxides at the silicon surfaces. One oxide is originated from the eff

FTIR, XPS and TPR studies of N2O decompo

FTIR, XPS and TPR studies of N2O decomposition over Cu-ZSM-5

✍ Chen, L.; Chen, H. Y.; Lin, J.; Tan, K. L. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 111 KB 👁 2 views

A Raman study of H2O2 and D2O2 vapor

✍ P. A. Giguére; T. K. K. Srinivasan 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 428 KB 👁 1 views