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FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate

✍ Scribed by Laroche, G.; Fitremann, J.; Gherardi, N.

Book ID: 122575599
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 547 KB
Volume: 273
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2013.02.095

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