In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates

✍ Scribed by N. Bertrand; B. Drévillon; J.E. Klemberg-Sapieha; L. Martinu

• Book ID: 114086135
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 514 KB
• Volume: 290-291
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/s0040-6090(96)09179-1