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FTIR and XPS investigation of Er-doped SiO2–TiO2 films

✍ Scribed by Q. Fang; M. Meier; J.J. Yu; Z.M. Wang; J.-Y. Zhang; J.X. Wu; A. Kenyon; P. Hoffmann; Ian W. Boyd


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
108 KB
Volume
105
Category
Article
ISSN
0921-5107

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X-ray photoelectron spectroscopy (XPS) results are presented on a series of alkali-doped and undoped TiO, films prepared by the sol-gel technique. TiOz films are deposited onto AIrOr and quartz substrates, using titanium isopropylalkoxide as the precursor, by dip-coating from the appropriate solutio