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FT-IR characterization of SiH bonds on the surface of silicon carbide.

✍ Scribed by P. Quintard; G. Ramis; M. Cauchetier; G. Busca; V. Lorenzelli

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

FT-IR characterization of silicon nitrid

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Formation of SiH bonds on the surface o

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✍ M. Handke; J. Dziedzic 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 264 KB