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Fringing Field Effects in Thin-Film Silicon Transistors on Glass

✍ Scribed by Nassar, C.J.; Revelli, J.F.; Williams, C.A.K.; Bowman, R.J.

Book ID: 115368720
Publisher: Institute of Electrical and Electronics Engineers
Year: 2010
Tongue: English
Weight: 685 KB
Volume: 6
Category: Article
ISSN: 1551-319X
DOI: 10.1109/JDT.2010.2052348

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