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Charge trapping effects in amorphous silicon/silicon nitride thin film transistors

✍ Scribed by A.R. Hepburn; C. Main; J.M. Marshall; C. van Berkel; M.J. Powell


Book ID
118334067
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
189 KB
Volume
97-98
Category
Article
ISSN
0022-3093

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