𝔖 Bobbio Scriptorium
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Fringe observation and depth of field in moiré analysis

✍ Scribed by Kafri, O. ;Keren, E.

Book ID
115329232
Publisher
The Optical Society
Year
1981
Tongue
English
Weight
455 KB
Volume
20
Category
Article
ISSN
1559-128X

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Oxygen-contaminated, melt-spun, binary Ti-Si alloys have been examined by using transmission electron microscopy. The microstructure of alloys in the range of 4 to 10% Si (by weight) are cellular and consist primarily of a-Ti and the silicide Ti5Si3. Contained only within the regions are small, appr