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Frequency-Dependent Dielectric Permittivity from 0 to 1 GHz: Time Domain Reflectometry Measurements Compared with Frequency Domain Network Analyzer Measurements

✍ Scribed by Heimovaara, T. J.; de Winter, E. J. G.; van Loon, W. K. P.; Esveld, D. C.

Book ID: 119693863
Publisher: American Geophysical Union
Year: 1996
Tongue: English
Weight: 880 KB
Volume: 32
Category: Article
ISSN: 0043-1397
DOI: 10.1029/96wr02695

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A new method is sugestcd to determine the dielectric permittivity OF materials, by means of time domain reflectomztry (TDR), for frequencies IJ 2 4 X 10' Hz independent of the value of the rclasntion frequency involved. The method uses the whole set of reflections from a dielectric sample which is