Measurement of dielectric permittivity with time domain reflectometry. Extension of the method to lower relaxation frequencies

✍ Scribed by G.P. De Loor; M.J.C. Van Gemert; H. Gravesteyn

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 402 KB
• Volume: 18
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(73)80440-3

✦ Synopsis

A new method is sugestcd to determine the dielectric permittivity OF materials, by means of time domain reflectomztry (TDR), for frequencies IJ 2 4 X 10' Hz independent of the value of the rclasntion frequency involved.

The method uses the whole set of reflections from a dielectric sample which is enclosed in ;i coxkd line and rerminatcd with 3 short circuit. The evaluation of E' and E", from the involved ttanscendcntal equation, has been csrricd out using a known graphical method as developed by Benoit and by Poley. Results of test measurements arc in perfccr agrccmcnt with vniucs obtained from the literature.