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Free radicals from the irradiation of o-nitrobenzyl compounds

โœ Scribed by Strom, E. Thomas; Weinstein, Julius


Book ID
126041054
Publisher
American Chemical Society
Year
1967
Tongue
English
Weight
286 KB
Volume
32
Category
Article
ISSN
0022-3263

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The transients involved in the mechanism of protection by thiol compounds against oxidative damage have been characterized by pulse radiolysis technique. The oxidizing properties of both thiyl (RS.) and thiyl-peroxyl radical (RSOO.), with E lying in the range +0.9 to +1.0 V, are well emphasized from