Scanning electron microscopy study of se
✦ LIBER ✦
Fracture testing of silicon microelements in situ in a scanning electron microscope: Stefan Johansson et al, J appl Phys, 63, 1988, 4799–4803
- Book ID
- 103469700
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 155 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0042-207X
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