Trivalent and hexavalent chromium oxides have been examined by time-of-flight laser microprobe mass spectrometry and Fourier transform ion cyclotron resonance mass spectrometry (FTICRMS). The positive-ion spectra show a strong correlation with the valency of chromium in the oxide. Thus, the positive
Fourier-transform mass spectroscopic studies of ionized atoms and clusters produced by laser vaporization of metals and semiconductors
โ Scribed by W.D. Reents; V.E. Bondybey
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 402 KB
- Volume
- 125
- Category
- Article
- ISSN
- 0009-2614
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โฆ Synopsis
A Fourier-transform mass spectrometer (FTMS) has been used to trap and detect cluster ions formed by laser vaporization of metals and semiconductors. It is shown that the technique works for those elements whose equilibrium vapors tend to contain molecular species. For more "typical" metals whose vapors are usually monatomic including most transition metals, only monatomic ions are obtained. Cluster ions were observed for silicon, germanium, and bismuth. No cluster ions were observed for aluminum, scandium, vanadium, or niobium.
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