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Fourier transform ir reflection techniques for characterization of polyimide films on copper substrates

✍ Scribed by Kristen Kelley; Yuichi Ishino; Hatsuo Ishida

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 567 KB
Volume: 154
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(87)90371-3

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