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A simple non-destructive technique for thickness and refractive index measurement of transparent films on reflective substrates: W. A. Pliskin and E. E. Conrad, Colloque sur l'optique des couches minces solides, Marseille, 8–15 Sept. 1963, J. Physique (in press)


Publisher
Elsevier Science
Year
1963
Tongue
English
Weight
124 KB
Volume
13
Category
Article
ISSN
0042-207X

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