Ellipsometric investigation of thin SiO2
✦ LIBER ✦
Ellipsometric investigations of oxide films on GaAs: K. H. Zaininger and A. C. Revesz, Colloque sur l'optique des couches minces solides, Marseille, 8–15 Sept. 1963, J. Physique (in press)
- Publisher
- Elsevier Science
- Year
- 1963
- Tongue
- English
- Weight
- 124 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0042-207X
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