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Ellipsometric investigation of thin SiO2 films obtained by various methods of preparation: A.G. Revesz and K.H. Zaininger, Colloque dur l'optique des couches minces solides, Marseille, 8–15 Sept. 1963, J. Physique (in press)

Publisher: Elsevier Science
Year: 1963
Tongue: English
Weight: 35 KB
Volume: 13
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(63)91900-6

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