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Fourier transform-ion cyclotron resonance mass spectrometry — A new tool for measuring highly charged ions in an electron beam ion trap

✍ Scribed by P. Beiersdorfer; St. Becker; B. Beck; S. Elliott; K. Widmann; L. Schweikhard

Book ID: 113286235
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 340 KB
Volume: 98
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)00011-9

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