๐”– Bobbio Scriptorium
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Electron beam potential depression as an ion trap in Fourier transform ion cyclotron resonance mass spectrometry

โœ Scribed by Christopher L. Hendrickson; Fawzi Hadjarab; David A. Laude Jr.

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
736 KB
Volume
141
Category
Article
ISSN
0168-1176

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