Among the various analysis modes which can be used in FTIR spectroscopy, the internal reflection mode enables us to gain near-surface information on solids or liquids. The interaction between the evanescent field created upon internal reflection of the infrared beam and a sample can be used to monit
β¦ LIBER β¦
Fourier Transform Infrared Reflection Spectroscopy Studies of Organic Films Formed on Inorganic Substrates
β Scribed by Udagawa, A.; Matsui, T.; Tanaka, S.
- Book ID
- 115360216
- Publisher
- Society for Applied Spectroscopy
- Year
- 1986
- Tongue
- English
- Weight
- 394 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0003-7028
No coin nor oath required. For personal study only.
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