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Fourier Transform Emission Spectroscopy of theA2Δ–X2Π Transition of SiH and SiD

✍ Scribed by R.S. Ram; R. Engleman Jr.; P.F. Bernath

Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
630 KB
Volume
190
Category
Article
ISSN
0022-2852

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✦ Synopsis

The emission spectra of the A2Delta-X2Pi transition of SiH and SiD have been observed at high resolution using a Fourier transform spectrometer. The molecules were excited in a Si hollow cathode lamp by passing a discharge through a mixture of Ne and a trace of H2 or D2. The present data, combined with the previous infrared vibration-rotation measurements, have been used to determine improved molecular constants for the ground and excited states of SiH and SiD. Copyright 1998 Academic Press.

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