Features of degradation in high-voltage
Features of degradation in high-voltage 4H-SiCp-i-ndiodes under the action of forward current pulses
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M. E. Levinshtein; P. A. Ivanov; J. W. Palmour; A. K. Agarwal; M. K. Das
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Article
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2011
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SP MAIK Nauka/Interperiodica
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English
โ 148 KB