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Features of degradation in high-voltage 4H-SiCp-i-ndiodes under the action of forward current pulses

✍ Scribed by M. E. Levinshtein; P. A. Ivanov; J. W. Palmour; A. K. Agarwal; M. K. Das


Book ID
111451012
Publisher
SP MAIK Nauka/Interperiodica
Year
2011
Tongue
English
Weight
148 KB
Volume
37
Category
Article
ISSN
1063-7850

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