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Formation of the interface between an oxide and a high-polymer solution

✍ Scribed by Yu. M. Mosin; A. F. Krivoshchepov; G. G. Shikhieva; A. V. Bulynko


Book ID
105607175
Publisher
Springer US
Year
1997
Tongue
English
Weight
380 KB
Volume
54
Category
Article
ISSN
0361-7610

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The interface between silicon and a high
✍ FΓΆrst, Clemens J.; Ashman, Christopher R.; Schwarz, Karlheinz; BlΓΆchl, Peter E. πŸ“‚ Article πŸ“… 2004 πŸ› Nature Publishing Group 🌐 English βš– 240 KB
The interface between silicon and a high
✍ FΓΆrst, Clemens J.; Ashman, Christopher R.; Schwarz, Karlheinz; BlΓΆchl, Peter E. πŸ“‚ Article πŸ“… 2004 πŸ› Nature Publishing Group 🌐 English βš– 240 KB

The ability of the semiconductor industry to continue scaling microelectronic devices to ever smaller dimensions (a trend known as Moore's Law) is limited by quantum mechanical effects: as the thickness of conventional silicon dioxide (SiO(2)) gate insulators is reduced to just a few atomic layers,