Formation and properties of oxides on silicon : R. P. Donovan, Proc. IEEE Symposium on “Molecular Concepts in Microelectronics”, St. Louis, May 24, 25, 26 (1965), p. 4A-1

• Book ID: 113190357
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 99 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90113-2