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Formation and microstructure of various thin film chromium silicide phases

✍ Scribed by C.J Bedeker; S Kritzinger; J.C Lombaard

Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
816 KB
Volume
141
Category
Article
ISSN
0040-6090

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Formation of Ytterbium Silicide Thin Fil
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Ytterbium silicide (YbSi 1.7 ) thin films were prepared on single-crystal Si (111) wafers and fused silica plates by solid-phase crystallization. The structure and phase transformations of the films were analysed by X-ray diffraction and Rutherford backscattering spectroscopy (RBS). The electrical p