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Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements

✍ Scribed by Sangiorgi, E.; Asenov, A.; Bennett, H. S.; Dutton, R. W; Esseni, D.; Giles, M. D.; Hane, M.; Nishi, K.; Ranaweera, J.; Selberherr, S.

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