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Flux noise and flux creep in YBCO thin films

✍ Scribed by Ferrari, M.J.; Johnson, M.; Wellstood, F.C.; Clarke, J.; Rosenthal, P.A.; Hammond, R.H.; Beasley, M.R.

Book ID: 114549785
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 395 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92408

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