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Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materials

โœ Scribed by L. FAN; D. PATERSON; I. McNULTY; M. M. J. TREACY; J. M. GIBSON

Book ID
108864310
Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
437 KB
Volume
225
Category
Article
ISSN
0022-2720

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