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Fluctuation and localization in quantum wires

โœ Scribed by T. Ando; H. Tamura

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
318 KB
Volume
9
Category
Article
ISSN
0749-6036

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We investigate the effects of interface localization due to microroughness in a sample presenting a quantum well and a quantum wire. The magnetoshift of the emission lines measured at different temperatures are analysed using a model where the average effect of the microroughness is represented by a