Floating-Gate Nonvolatile Memory With Ultrathin 5-nm Tunnel Oxide

✍ Scribed by Yanjun Ma; Rui Deng; Nguyen, H.; Bin Wang; Pesavento, A.; Niset, M.; Paulsen, R.

• Book ID: 114619220
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 761 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2006538