Flicker noise behavior of MOFSETs fabricated in 0.5 μm fully depleted (FD) silicon-on-sapphire (SOS) CMOS in weak, moderate, and strong inversion

✍ Scribed by Ericson, M.N.; Britton, C.L.; Rochelle, J.M.; Blalock, B.J.; Binkley, D.M.; Wintenberg, A.L.; Williamson, B.D.

• Book ID: 111676750
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 716 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2003.815146