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Flash-lamp annealing of SiSiO2 transition layer defects

✍ Scribed by Lysenko, V. S. ;Zimenko, V. I. ;Tyagulskii, I. P. ;Osiyuk, I. N. ;Snitko, O. V. ;Sytenko, T. N.

No coin nor oath required. For personal study only.

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