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Fixed pattern noise of amplified MOS imager in scaling down

✍ Scribed by Fumihiko Andoh; Katsu Tanaka; Hiroshi Kawashima; Masao Yamawaki

Book ID: 102819850
Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 785 KB
Volume: 79
Category: Article
ISSN: 8756-663X
DOI: 10.1002/ecjb.4420790811

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