๐”– Bobbio Scriptorium
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Fixed pattern noise of amplified MOS imager in scaling down

โœ Scribed by Fumihiko Andoh; Katsu Tanaka; Hiroshi Kawashima; Masao Yamawaki


Book ID
102819850
Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
785 KB
Volume
79
Category
Article
ISSN
8756-663X

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Study on Reduction Methods of Moirรฉ Nois
โœ Jun Mochizuki; Toshio Asano ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 502 KB

## Abstract Creating valid digital images for display surfaces is vital for the quantification of display quality (defects, spots) for display devices. However, when imaging a spatially discrete display surface using individual acquisition elements, an acquisition moirรฉ appears in the acquisition i